LA Testing is proud to announce that SEM services are now available. A Scanning Electron Microscope (SEM) is an imaging technique that uses a beam of high energy and finely focused electrons produced by an electron gun that scans the sample in a raster pattern.
The primary or ‘incident beam’ of electrons interacts with the surface of the sample. The interaction then produces a secondary beam of electrons that carry information about the surface morphology. The electrons in the secondary beam are collected by a special detector, converted to a voltage signal, amplified, and used to produce an image on a cathode-ray tube (CRT).
Some practical SEM applications include:
- Metallurgical Studies
- Failure Analysis
- Contaminant Analysis
- Deposits and Wear Debris Analysis
- Particle Sizing and Distribution
- Elemental Identification (when used with EDX detector)
- Char Characterization (residential and wildfires investigations)
- Paint Characterization
- Specialized Forensic Analysis
There are many advantageous to utilizing the SEM including an increased depth of field which allows for a greater amount of sample to remain in focus. Also the ability to create rapid and high resolution images showing morphological characteristics that can be more readily analyzed at higher magnifications.
“The capabilities of a scanning electron microscope can mean the difference between a basic laboratory and a first rate one,” reported Ben Sublasky, National Director of Client Services for EMSL Analytical and LA Testing. “A SEM is essential in our industry to excel,” he continued.
LA Testing operates laboratories in Los Alamitos and Pasadena, California. The laboratories are staffed with some of the industry’s most respected scientists who utilize state-of-the-art equipment to provide laboratory services. For more information on SEM Services visit www.LATesting.com or call (800)303-0047 and ask for Jerry Drapala or Derrick Tanner.